A simple demonstration of frustrated total internal reflection

نویسندگان

  • Zoltán Vörös
  • Rainer Johnsen
چکیده

We describe a quantitative and inexpensive method of demonstrating frustrated total internal reflection based on the attenuation of a laser beam through a wedge-shaped air gap between two glass prisms. An advantage of this method is that the thickness of the air gap can be determined by observing interference effects with only a slight modification of the setup. The experiment avoids the need to employ high-precision translation stages as is often the case in standard demonstrations of frustrated total internal reflection. © 2008 American Association of Physics Teachers. DOI: 10.1119/1.2904473

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film.

Simple and explicit expressions for the phase shifts that p- and s-polarized light experience in frustrated total internal reflection (FTIR) and optical tunneling by an embedded low-index thin film are obtained. The differential phase shifts in reflection and transmission deltar, deltat are found to be identical, and the associated ellipsometric parameters psir, psit are governed by a simple re...

متن کامل

Time-domain measurements of reflection delay in frustrated total internal reflection.

We present experimental evidence that the contribution of the Goos-Hänchen shift to tunneling delay is suppressed in frustrated total internal reflection. We use a Hong-Ou-Mandel interferometer to perform direct time measurements of reflection delays with femtosecond resolution at optical frequencies, and take advantage of a liquid-crystal-filled double-prism structure to dynamically change the...

متن کامل

A Thin Layer Imaging with the Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy (TIRFM) is an optical technique that allows imaging of a thin layer of the sample with a thickness of about 100-200 nm. It is used in science of cell biology to study cellular processes, especially near the membranes of living cells. This method is based on the total internal reflection phenomenon, where the evanescent wave is generated in the l...

متن کامل

Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film.

The condition for obtaining a differential (or ellipsometric) quarter-wave retardation when p- and s-polarized light of wavelength λ experience frustrated total internal reflection (FTIR) and optical tunneling at angles of incidence ϕ ≥ the critical angle by a transparent thin film (medium 1) of low refractive index n1 and uniform thickness d, which is embedded in a transparent bulk medium 0 of...

متن کامل

Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection.

An all-transparent symmetric trilayer structure, which consists of a high-index center layer coated on both sides by a low-index film and embedded in a high-index prism, can function as an efficient polarizer or polarizing beam splitter under conditions of frustrated total internal reflection over a wide range of incidence angles. For a given set of refractive indices, all possible solutions fo...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2008